Dr. Giovanni Franco Crosta
SPIE Involvement:
Area of Expertise:
inverse problems , image classification , electromagnetics , morphological analysis , fluid dynamics
Profile Summary

retired; previous position (1983-2015): tenured researcher, State Universities of Milan, Milan, IT.
(since 2007) Fellow of the Electromagnetics Academy, Cambridge, MA.
(1999) visiting scientist, Dept. of Electrical Engineering, University of Massachusetts, Lowell, MA.
(1992) short term visitor, Institute for Mathematics and Applications, Minneapolis, MN.
(1989) visiting Associate Professor, Dept. of Mathematics, Texas A&M Univ., College Station, TX.
(1988) visiting scholar, Dept. of Mathematical Sciences, Univ. of Delaware, Newark, DE.
(1975-1983) independent consultant.
(1974-1975) tactical control assistant, NATO Hawk anti-aircraft artillery.
Author of 65 peer-reviewed articles, 37 editor-reviewed articles, 65 conference abstracts.
Presenter of 118 conference talks, 12 conference posters, 62 seminars.
Co-editor of 5 special issues and proceedings. Co-author of 1 textbook.
Signer of 84 Mathematical Reviews.
Research interests: inverse problems for partial differential equations (electromagnetics, acoustics, fluid dynamics), image recognition, materials characterization, morphogenesis.
Teaching assignments: (1995 to 2014, University of Milan Bicocca) Mathematical models & methods for the environmental sciences, (2005-2007, same) Dynamics and control of environmental systems, (2007, same) Process control,(1991-1994, University of Milan, IT) Theory of computing machines, (1989, Texas A&M University, College Station, TX) Calculus I, (1981- 1988, University of Milan, IT) Physics II.
Advisor or co-advisor of 80 M.Sc. thesis projects
Professional association:
American Mathematical Society, Applied Computational Electromagnetics Society, Associazione Meccanica VA (hon.), Imaging Science and Technology Society (emeritus), Institute of Electrical and Electronics Engineers (life senior), Materials Research Society, Mathematical Association of America, SPIE.
Publications web site:
(2016 Feb 24)
Publications (24)

Proceedings Article | 4 March 2019
Proc. SPIE. 10881, Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues XVII
KEYWORDS: Dynamical systems, Data modeling, Systems modeling, Macromolecules, Clocks, Genomics, Mathematical modeling, Molecules

Proceedings Article | 7 May 2018
Proc. SPIE. 10671, Metamaterials XI
KEYWORDS: Electromagnetism, Scattering, Metamaterials, Electromagnetic radiation, Convolution, Mathematical modeling, Dielectrics, Electromagnetic scattering, Dielectric dispersion

Proceedings Article | 29 May 2014
Proc. SPIE. 9073, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XV
KEYWORDS: Scattering, Image classification, Atmospheric particles, Aerosols, Light scattering, Particles, Laser scattering, Bacteria, Optical spheres, Feature extraction

Proceedings Article | 28 May 2014
Proc. SPIE. 9121, Multisensor, Multisource Information Fusion: Architectures, Algorithms, and Applications 2014
KEYWORDS: Scattering, Light scattering, Laser scattering, Particles, Sensors, Atmospheric particles, Aerosols, Pulsed laser operation, Mirrors, Optical spheres

Proceedings Article | 29 May 2013
Proc. SPIE. 8723, Sensing Technologies for Global Health, Military Medicine, and Environmental Monitoring III
KEYWORDS: Particles, Scattering, Light scattering, Feature extraction, Atmospheric particles, Statistical analysis, Aerosols, Detection and tracking algorithms, Fourier transforms, Optical spheres

Proceedings Article | 7 June 2011
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Nonlinear filtering, Nanocomposites, Image filtering, Visualization, Particles, Image classification, Polymers, Image processing, Image analysis, Electron microscopes

Showing 5 of 24 publications
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