Prof. Giuseppe Bonifazi
Full Professor at Sapienza Univ di Roma
SPIE Involvement:
Author | Instructor
Publications (54)

Proceedings Article | 2 March 2020
Proc. SPIE. 11287, Photonic Instrumentation Engineering VII
KEYWORDS: Hyperspectral imaging, Short wave infrared radiation, Principal component analysis, Statistical analysis, Soil science, Calibration, Chemical analysis, Chemometrics, Arsenic, Soil contamination

Proceedings Article | 12 November 2019
Proc. SPIE. 11197, SPIE Future Sensing Technologies
KEYWORDS: Hyperspectral imaging, Short wave infrared radiation, Optical sensors, Coastal modeling, Organisms, Ocean optics, Pollution, Chemometrics, Environmental sensing, Statistical modeling

Proceedings Article | 12 July 2019
Proc. SPIE. 11058, Optics for Arts, Architecture, and Archaeology VII
KEYWORDS: Hyperspectral imaging, Short wave infrared radiation, Principal component analysis, Visualization, Colorimetry, Printing, Humidity, Spectrophotometry

Proceedings Article | 14 May 2019
Proc. SPIE. 10986, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXV
KEYWORDS: Visible radiation, Principal component analysis, Statistical analysis, Data modeling, Sensors, Calibration, Reflectivity, Near infrared spectroscopy, Chemometrics, Statistical modeling

Proceedings Article | 10 May 2019
Proc. SPIE. 11007, Advanced Environmental, Chemical, and Biological Sensing Technologies XV
KEYWORDS: Hyperspectral imaging, Safety, Principal component analysis, Statistical analysis, Calibration, Reflectivity, Chemical analysis, Statistical modeling, Standards development

Showing 5 of 54 publications
Course Instructor
SC511: Applied Imaging Based Morphology
This course provides the attendee with basic working knowledge to perform morphological and morphometrical based characterization of closed domains (objects, cells, biological tissues, particles, etc.). It gives the fundamentals of digital morphology and shows its great potential for use in many research and industrial sectors. Case studies are presented and evaluated. Attendees will become fluent in the selection and design of analytical tools and architectures used to perform a morphological and morphometrical characterization of electronic images content.
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