Prof. Giuseppe Viesti
at Instituto Nazionale Di Fisica Nucleare
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

PROCEEDINGS ARTICLE | May 24, 2006
Proc. SPIE. 6213, Non-Intrusive Inspection Technologies
KEYWORDS: Electronics, Radon, Reflection, Sensors, Particles, Photomultipliers, Crystals, Scintillators, Inspection, Gamma radiation

Conference Committee Involvement (1)
Non-Intrusive Inspection Technologies
17 April 2006 | Orlando (Kissimmee), Florida, United States
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