Dr. Godai Miyaji
at Tokyo Univ of Agriculture and Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (4)

PROCEEDINGS ARTICLE | February 19, 2018
Proc. SPIE. 10520, Laser-based Micro- and Nanoprocessing XII
KEYWORDS: Plasmonics, Femtosecond phenomena, Interfaces, Silicon, Reflectivity, Laser ablation, Near field, Solids, Scanning probe microscopy, Pulsed laser operation

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10091, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXII
KEYWORDS: Oxides, Plasmonics, Nanostructures, Surface plasmon polaritons, Femtosecond phenomena, Nanostructuring, Metals, Electrons, Interfaces, Scanning electron microscopy, Laser ablation, Gallium nitride, Near field, Solids, Nanolithography

PROCEEDINGS ARTICLE | January 18, 2011
Proc. SPIE. 7747, 16th International School on Quantum Electronics: Laser Physics and Applications
KEYWORDS: Ultrafast phenomena, Nanostructures, Femtosecond phenomena, Nanostructuring, Polarization, Molecules, Oxygen, Laser ablation, Solids, Molecular lasers

PROCEEDINGS ARTICLE | February 13, 2009
Proc. SPIE. 7201, Laser Applications in Microelectronic and Optoelectronic Manufacturing VII
KEYWORDS: Thin films, Nanostructures, Femtosecond phenomena, Nanostructuring, Polarization, Silicon, Scanning electron microscopy, Laser ablation, Scanning probe microscopy, Neon

Conference Committee Involvement (1)
Laser Applications in Microelectronic and Optoelectronic Manufacturing XV
25 January 2010 | San Francisco, California, United States
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