Prof. Gordon S. Kino
W M Keck Foundation Professor of Electrical Engg at
SPIE Involvement:
Conference Program Committee | Symposium Chair | Conference Chair | Author | Editor
Publications (58)

SPIE Journal Paper | March 2, 2012
JBO Vol. 17 Issue 02
KEYWORDS: Confocal microscopy, In vivo imaging, Luminescence, Microelectromechanical systems, Tissues, Mirrors, Endoscopes, Colorectal cancer, Collimation, Scanners

SPIE Journal Paper | May 1, 2010
JBO Vol. 15 Issue 03
KEYWORDS: Skin, Microscopes, Green fluorescent protein, In vivo imaging, Confocal microscopy, 3D image processing, Visualization, Mouse models, Molecular imaging, Luminescence

SPIE Journal Paper | March 1, 2010
JBO Vol. 15 Issue 02
KEYWORDS: Microscopes, Relays, Microelectromechanical systems, Mirrors, Confocal microscopy, GRIN lenses, Gradient-index optics, Actuators, Brain, Neuroimaging

PROCEEDINGS ARTICLE | February 25, 2010
Proc. SPIE. 7567, Design and Performance Validation of Phantoms Used in Conjunction with Optical Measurement of Tissue II
KEYWORDS: Confocal microscopy, Microscopes, Mirrors, Tissues, Scattering, Light scattering, Reflectivity, Monte Carlo methods, Objectives, Tissue optics

PROCEEDINGS ARTICLE | October 5, 2009
Proc. SPIE. 7503, 20th International Conference on Optical Fibre Sensors
KEYWORDS: Microelectromechanical systems, Signal to noise ratio, Mirrors, Fabry–Perot interferometers, Modulation, Sensors, Interference (communication), Gyroscopes, Signal detection, Prototyping

PROCEEDINGS ARTICLE | May 16, 2008
Proc. SPIE. 7004, 19th International Conference on Optical Fibre Sensors
KEYWORDS: Modulation, Fiber optics, Fiber optic gyroscopes, Backscatter, Sensors, Fiber lasers, Frequency modulation, Laser stabilization, Fermium, Gyroscopes

Showing 5 of 58 publications
Conference Committee Involvement (10)
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVI
27 January 2009 | San Jose, California, United States
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
21 January 2008 | San Jose, California, United States
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIV
24 January 2007 | San Jose, California, United States
Sensors for Harsh Environments III
3 October 2006 | Boston, Massachusetts, United States
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
24 January 2006 | San Jose, California, United States
Showing 5 of 10 published special sections
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