Dr. Gottfried J. Frankowski
President at GFMesstechnik GmbH
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | February 7, 2012
Proc. SPIE. 8254, Emerging Digital Micromirror Device Based Systems and Applications IV
KEYWORDS: 3D acquisition, Cameras, Sensors, Calibration, Image resolution, 3D metrology, Projection systems, Sensor calibration, Digital Light Processing, 3D image processing

SPIE Journal Paper | April 1, 2011
JBO Vol. 16 Issue 04
KEYWORDS: Skin, Tissue optics, In vivo imaging, Optical coherence tomography, Microscopy, Haptic technology, Laser scanners, Biomedical optics, Dermatology, Physiology

PROCEEDINGS ARTICLE | February 15, 2011
Proc. SPIE. 7932, Emerging Digital Micromirror Device Based Systems and Applications III
KEYWORDS: Digital signal processing, 3D acquisition, Cameras, Sensors, Image processing, Inspection, Data acquisition, 3D metrology, Digital Light Processing, 3D image processing

PROCEEDINGS ARTICLE | February 14, 2009
Proc. SPIE. 7210, Emerging Digital Micromirror Device Based Systems and Applications
KEYWORDS: Mirrors, Imaging systems, Cameras, Calibration, Skin, 3D metrology, Projection systems, 3D scanning, Digital Light Processing, Structured light

PROCEEDINGS ARTICLE | April 17, 2008
Proc. SPIE. 6945, Optics and Photonics in Global Homeland Security IV
KEYWORDS: Light sources, Safety, Biometrics, Facial recognition systems, 3D acquisition, Glasses, Control systems, 3D metrology, Micromirrors, 3D scanning

PROCEEDINGS ARTICLE | June 18, 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Fringe analysis, Calibration, Manufacturing, Inspection, 3D metrology, Projection systems, Measurement devices, Digital recording, Optics manufacturing, Digital Light Processing

Showing 5 of 12 publications
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