Dr. Gour S. Pati
Associate Professor at Delaware State Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (9)

PROCEEDINGS ARTICLE | February 20, 2015
Proc. SPIE. 9342, Solid State Lasers XXIV: Technology and Devices
KEYWORDS: Target detection, Signal to noise ratio, Electronics, Avalanche photodetectors, LIDAR, Sensors, Temporal resolution, Signal detection, Pulsed laser operation, Laser systems engineering

PROCEEDINGS ARTICLE | June 9, 2014
Proc. SPIE. 9080, Laser Radar Technology and Applications XIX; and Atmospheric Propagation XI
KEYWORDS: Reflectors, Avalanche photodetectors, Polarization, Imaging systems, LIDAR, Sensors, Polarizers, Wave plates, Polarimetry, Spatial resolution

PROCEEDINGS ARTICLE | February 17, 2011
Proc. SPIE. 7949, Advances in Slow and Fast Light IV
KEYWORDS: Electronics, Clocks, Chemical species, Magnetism, Optical testing, Raman spectroscopy, Atomic clocks, Bragg cells, Microwave radiation, Rubidium

PROCEEDINGS ARTICLE | February 18, 2010
Proc. SPIE. 7612, Advances in Slow and Fast Light III
KEYWORDS: Clocks, Modulation, Chemical species, Magnetism, Adaptive optics, Raman spectroscopy, Microwave radiation, Cesium, Rubidium, Standards development

PROCEEDINGS ARTICLE | February 11, 2008
Proc. SPIE. 6904, Advances in Slow and Fast Light
KEYWORDS: Beam splitters, Slow light, Dispersion, Raman spectroscopy, Heterodyning, Bragg cells, Laser beam diagnostics, Signal detection, Beam propagation method, Radio propagation

PROCEEDINGS ARTICLE | February 11, 2008
Proc. SPIE. 6906, Quantum Electronics Metrology
KEYWORDS: Clocks, Polarization, Chemical species, Raman spectroscopy, Atomic clocks, Bragg cells, Laser beam diagnostics, Cesium, Rubidium, Global Positioning System

Showing 5 of 9 publications
Conference Committee Involvement (9)
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
2 February 2019 | San Francisco, California, United States
Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
29 January 2018 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
30 January 2017 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX
15 February 2016 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII
8 February 2015 | San Francisco, California, United States
Showing 5 of 9 published special sections
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