Dr. Graciela R. Guel
Process Engineer at Intel Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 8 December 1995
Proc. SPIE. 2621, 15th Annual BACUS Symposium on Photomask Technology and Management
KEYWORDS: Lithography, Reticles, Metrology, Quartz, Glasses, Light scattering, Manufacturing, Inspection, Printing, Photomasks

Proceedings Article | 1 April 1994
Proc. SPIE. 2174, Advanced Flat Panel Display Technologies
KEYWORDS: Lithography, Microscopes, Reticles, Calibration, Metals, Manufacturing, Inspection, Photomasks, YAG lasers, Flat panel displays

Proceedings Article | 26 June 1992
Proc. SPIE. 1634, Laser Diode Technology and Applications IV
KEYWORDS: Semiconductors, Etching, Argon, Dry etching, Ions, Gallium arsenide, Semiconductor lasers, Photoresist materials, Aluminum, Metalorganic chemical vapor deposition

Proceedings Article | 26 June 1992
Proc. SPIE. 1634, Laser Diode Technology and Applications IV
KEYWORDS: Etching, Interfaces, Gallium arsenide, Sulfur, Heat treatments, Oxygen, Semiconductor lasers, Wet etching, Metalorganic chemical vapor deposition, Technologies and applications

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