Graham Jeffrey
Chief Optical Engineer at Leonardo MW Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 October 2019
Proc. SPIE. 11163, Emerging Imaging and Sensing Technologies for Security and Defence IV
KEYWORDS: Amorphous silicon, Metamaterials, Near infrared, Electron beam lithography, Refractive index, Nanostructuring, Silica, Dielectrics, Lens design, Absorption

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Amorphous silicon, Near infrared, Plasmonics, Nanostructures, Electron beam lithography, Refractive index, Lenses, Cameras, Dielectrics, Nanolithography

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