Grant Davis
Technical Marketing Engineer at Mentor Graphics Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 November 2007
Proc. SPIE. 6730, Photomask Technology 2007
KEYWORDS: Metrology, Data modeling, Visualization, Databases, Interfaces, Manufacturing, Computer programming, Photomasks, Optical proximity correction, Manufacturing equipment

Proceedings Article | 25 May 2007
Proc. SPIE. 6607, Photomask and Next-Generation Lithography Mask Technology XIV
KEYWORDS: Lithography, Metrology, Visualization, Image processing, Interfaces, Scanning electron microscopy, Design for manufacturing, Photomasks, Critical dimension metrology, Semiconducting wafers

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