Prof. Gregory Muravin
at Margan Physical Diagnostics
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II
KEYWORDS: X-ray optics, Safety, Hydrogen, Reliability, Inspection, Corrosion, Optical testing, Chemical analysis, X-ray imaging, Failure analysis

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II
KEYWORDS: Defect detection, Sensors, Metals, X-rays, Reliability, Inspection, Interference (communication), Signal processing, Acoustic emission, Temperature metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top