Silicon nanowires (SiNWs) have undergone intensive research for their application in novel integrated systems such as
field effect transistor (FET) biosensors and mass sensing resonators profiting from large surface-to-volume ratios (nano
dimensions). Such devices have been shown to have the potential for outstanding performances in terms of high
sensitivity, selectivity through surface modification and unprecedented structural characteristics. This paper presents the
results of mechanical characterization done for various types of suspended SiNWs arranged in a 3D array. The
characterization has been performed using techniques based on atomic force microscopy (AFM). This investigation is a
necessary prerequisite for the reliable and robust design of any biosensing system. This paper also describes the applied
investigation methodology and reports measurement results aggregated during series of AFM-based tests.