Dr. Gufran Sayeed Khan
Associate Professor at Indian Institute of Technology Delhi
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Wavefronts, Sensors, Collimation, Error analysis, Spatial resolution, Freeform optics, Metrology, Wavefront sensors, Algorithm development, Optical design

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical alignment, Freeform optics, Metrology, Optics manufacturing, Diamond turning, Optical components, Error analysis

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Wavefronts, Image registration, Photovoltaics, Metrology, Data integration, Manufacturing, Phase measurement, Error analysis, Sensors, Freeform optics

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Wavefronts, Sensors, Error analysis, Zemax, Ray tracing, Wavefront reconstruction, Wavefront sensors, Spherical lenses, Photovoltaics, Collimation

SPIE Journal Paper | 22 August 2017
OE Vol. 56 Issue 08
KEYWORDS: Wavefronts, Photovoltaics, Sensors, Aspheric lenses, Diffractive optical elements, Freeform optics, Interferometry, Optical engineering, Metrology, Error analysis

Showing 5 of 11 publications
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