Guillaume Pailloncy
at IEMN
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oxides, Roentgenium, Silicon, Diffusion, Resistance, Interference (communication), Capacitance, Field effect transistors, Instrument modeling, Advanced distributed simulations

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Reflection, Diffusion, Resistance, Physics, Interference (communication), Telecommunications, Field effect transistors, Microwave radiation, Performance modeling, Instrument modeling

PROCEEDINGS ARTICLE | May 12, 2003
Proc. SPIE. 5113, Noise in Devices and Circuits
KEYWORDS: Annealing, Silicon, Resistance, Fourier transforms, Capacitance, Transistors, Field effect transistors, Molybdenum, Microwave radiation, Semiconducting wafers

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