Guiwen Lin
at Shenzhen Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Modulation, Imaging systems, Cameras, Calibration, Image processing, 3D metrology, Projection systems, 3D vision, Binary data, 3D image processing

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