Prof. Gunther Notni
Head of Optical Systems at Fraunhofer-IOF
SPIE Involvement:
Conference Program Committee | Symposium Chair | Author
Publications (116)

Proceedings Article | 21 June 2019
Proc. SPIE. 11061, Automated Visual Inspection and Machine Vision III
KEYWORDS: Optical filters, Imaging systems, Cameras, Sensors, Copper, Inspection, 3D metrology, Image filtering, Bandpass filters

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical filters, Light sources, 3D acquisition, Imaging systems, Cameras, Calibration, Multispectral imaging, Specular reflections, High dynamic range imaging, 3D image processing

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Thermography, Mid-IR, 3D image reconstruction, Cameras, 3D modeling, Quality measurement, 3D metrology, Gas lasers, Device simulation, 3D image processing

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Backscatter, Imaging systems, Sensors, Modulators, Computer simulations, 3D modeling, 3D metrology, Projection systems, Reconstruction algorithms, Photometry, Structured light

Proceedings Article | 14 May 2019
Proc. SPIE. 10986, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXV
KEYWORDS: Chromatic aberrations, Edge detection, Imaging systems, Sensors, Calibration, Image processing, Wavelets, Image quality, Spatial resolution

Proceedings Article | 14 May 2019
Proc. SPIE. 10986, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXV
KEYWORDS: Optical filters, CMOS sensors, Cameras, Sensors, Photons, Quantum efficiency, Manufacturing, Image sensors, CMOS cameras, RGB color model

Showing 5 of 116 publications
Conference Committee Involvement (19)
Dimensional Optical Metrology and Inspection for Practical Applications VIV
26 April 2020 | Anaheim, California, United States
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Showing 5 of 19 published special sections
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