Prof. Gunther Notni
Head of Optical Systems at Fraunhofer-IOF
SPIE Involvement:
Conference Program Committee | Author
Publications (139)

SPIE Journal Paper | 26 September 2020
OE Vol. 59 Issue 09

Proceedings Article | 1 June 2020 Paper
Proc. SPIE. 11396, Computational Imaging V
KEYWORDS: Near infrared, Data modeling, Cameras, Calibration, Image segmentation, Clouds, Frequency modulation, Fermium, RGB color model, Structured light

Proceedings Article | 19 May 2020 Presentation + Paper
Proc. SPIE. 11397, Dimensional Optical Metrology and Inspection for Practical Applications IX
KEYWORDS: Optical filters, Fringe analysis, Cameras, Sensors, 3D modeling, 3D metrology, Projection systems, Active sensors, Binary data, Device simulation

Proceedings Article | 27 April 2020 Presentation
Proc. SPIE. 11392, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXVI
KEYWORDS: Optical filters, CMOS sensors, Imaging systems, Cameras, Sensors, Matrices, Image acquisition, Image sensors, System integration, RGB color model

Proceedings Article | 21 April 2020 Paper
Proc. SPIE. 11397, Dimensional Optical Metrology and Inspection for Practical Applications IX
KEYWORDS: Near infrared, Light sources, Modulation, Cameras, Sensors, Image processing, Field programmable gate arrays, 3D metrology, Projection systems, Freeform optics, 3D image processing

Showing 5 of 139 publications
Conference Committee Involvement (21)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Dimensional Optical Metrology and Inspection for Practical Applications X
11 April 2021 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Showing 5 of 21 Conference Committees
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