Guoguang Lu
at CIOMP
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 31 December 2013
Proc. SPIE. 9042, 2013 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Optical spheres, High power lasers, Reliability, Laser development, Laser marking, Control systems, Semiconductor lasers, Diodes, Temperature metrology, Data analysis

Proceedings Article | 13 November 2010
Proc. SPIE. 7844, Semiconductor Lasers and Applications IV
KEYWORDS: Statistical analysis, Lifetime testing equipment, Data modeling, High power lasers, Reliability, Nd:YAG lasers, Solid state lasers, Semiconductor lasers, Diodes, Failure analysis

Proceedings Article | 18 November 2008
Proc. SPIE. 7135, Optoelectronic Materials and Devices III
KEYWORDS: Semiconductors, Mirrors, Quantum wells, Numerical simulations, Fiber lasers, Semiconductor lasers, Vertical cavity surface emitting lasers, Optical pumping, Metalorganic chemical vapor deposition, Semiconducting wafers

Proceedings Article | 19 November 2007
Proc. SPIE. 6782, Optoelectronic Materials and Devices II
KEYWORDS: Quantum wells, Continuous wave operation, Optical fabrication equipment, High power lasers, Gallium arsenide, Reliability, Semiconductor lasers, Vertical cavity surface emitting lasers, Gallium, Oxidation

Proceedings Article | 30 December 2005
Proc. SPIE. 6028, ICO20: Lasers and Laser Technologies
KEYWORDS: Semiconductors, Mirrors, Quantum wells, High power lasers, Laser applications, Reflectivity, Semiconductor lasers, Vertical cavity surface emitting lasers, Optical pumping, Absorption

Proceedings Article | 22 December 2005
Proc. SPIE. 6028, ICO20: Lasers and Laser Technologies
KEYWORDS: Quantum wells, Mechanics, Nd:YAG lasers, Solid state lasers, Physics, Semiconductor lasers, Diodes, Electro optics, Temperature metrology

Showing 5 of 9 publications
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