Dr. Guohua Yang
at Institute of Semiconductors CAS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 6, 2006
Proc. SPIE. 6352, Optoelectronic Materials and Devices
KEYWORDS: Semiconducting wafers, Wafer bonding, Infrared imaging, Image transmission, Interfaces, Gallium arsenide, Semiconductors, Annealing, Protactinium, Scanning electron microscopy

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