Guoquan Zheng
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Infrared cameras, Infrared sensors, Infrared imaging, Visible radiation, Fringe analysis, Cameras, Sensors, Calibration, 3D metrology, Projection systems

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