Dr. Gwyn P. Williams
at Thomas Jefferson National Accelerator Facility
SPIE Involvement:
Conference Chair | Author
Publications (14)

PROCEEDINGS ARTICLE | May 20, 2004
Proc. SPIE. 5374, Emerging Lithographic Technologies VIII
KEYWORDS: Lithography, Mirrors, X-rays, Printing, Near field, Collimation, Photomasks, Synchrotrons, Semiconducting wafers, X-ray lithography

PROCEEDINGS ARTICLE | March 25, 2004
Proc. SPIE. 5277, Photonics: Design, Technology, and Packaging
KEYWORDS: Femtosecond phenomena, Laser scattering, Magnetism, Fourier transforms, Imaging spectroscopy, Terahertz radiation, Synchrotrons, Synchrotron radiation, Thomson scattering, Bessel functions

PROCEEDINGS ARTICLE | June 16, 2003
Proc. SPIE. 5037, Emerging Lithographic Technologies VII
KEYWORDS: Lithography, X-rays, Manufacturing, Physics, Printing, Near field, Near field diffraction, Photomasks, Semiconducting wafers, X-ray lithography

PROCEEDINGS ARTICLE | October 25, 1999
Proc. SPIE. 3775, Accelerator-based Sources of Infrared and Spectroscopic Applications
KEYWORDS: Microscopes, Mirrors, Spectroscopy, Ultraviolet radiation, Infrared spectroscopy, Infrared radiation, Synchrotrons, Picosecond phenomena, Synchrotron radiation, Free electron lasers

PROCEEDINGS ARTICLE | October 25, 1999
Proc. SPIE. 3775, Accelerator-based Sources of Infrared and Spectroscopic Applications
KEYWORDS: Potassium, Scattering, Metals, Molecules, Reflectivity, Infrared spectroscopy, Adsorption, Infrared radiation, Synchrotrons, Fullerenes

PROCEEDINGS ARTICLE | October 25, 1999
Proc. SPIE. 3775, Accelerator-based Sources of Infrared and Spectroscopic Applications
KEYWORDS: Signal to noise ratio, Diffraction, Sensors, Spectroscopy, Microscopy, Electrons, Infrared radiation, Synchrotrons, Synchrotron radiation, Free electron lasers

Showing 5 of 14 publications
Conference Committee Involvement (1)
Accelerator-Based Infrared Sources and Applications
29 July 1997 | San Diego, CA, United States
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