Dr. Gyanendra S. Lodha
at Raja Ramanna Ctr for Advanced Technology
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | December 11, 1998
Proc. SPIE. 3448, Crystal and Multilayer Optics
KEYWORDS: Multilayers, Polishing, Scattering, X-rays, Reflectivity, Surface roughness, Scanning probe microscopy, Silicon carbide, Semiconducting wafers, Zerodur

PROCEEDINGS ARTICLE | November 19, 1998
Proc. SPIE. 3444, X-Ray Optics, Instruments, and Missions
KEYWORDS: Mirrors, Multilayers, Sensors, X-rays, Reflectivity, Space telescopes, Reflector telescopes, X-ray telescopes, Hard x-rays, Performance modeling

PROCEEDINGS ARTICLE | November 19, 1998
Proc. SPIE. 3444, X-Ray Optics, Instruments, and Missions
KEYWORDS: Gold, Reflectors, Mirrors, X-ray optics, Glasses, X-rays, Reflectivity, Epoxies, X-ray telescopes, Hard x-rays

PROCEEDINGS ARTICLE | July 11, 1997
Proc. SPIE. 3113, Grazing Incidence and Multilayer X-Ray Optical Systems
KEYWORDS: Telescopes, Mirrors, Multilayers, Sputter deposition, Glasses, X-rays, Reflectivity, Space telescopes, X-ray telescopes, Hard x-rays

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