Gyo-Hun Koo
at Kyungpook National Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 June 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Microbolometers, Oxides, Thin films, Sputter deposition, X-ray diffraction, Nickel, Resistance, Oxygen, Scanning electron microscopy, Temperature metrology

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