Prof. Gyung-Bum Kim
at Korea National Univ of Transportation
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 February 2010 Paper
Yeon Ki Hong, Gyung Bum Kim, Young-Jun Jin
Proceedings Volume 7584, 758411 (2010) https://doi.org/10.1117/12.839933
KEYWORDS: Laser scattering, Inspection, Semiconducting wafers, Cameras, Surface roughness, Scattering, Solar cells, Light scattering, Laser development, Silicon

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