H. C. Ong
at Jilin Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 October 2001
Proc. SPIE. 4580, Optoelectronics, Materials, and Devices for Communications
KEYWORDS: Ultraviolet radiation, Annealing, Luminescence, X-ray diffraction, Chemical vapor deposition, Atomic force microscopy, Excitons, Zinc oxide, Metalorganic chemical vapor deposition, Temperature metrology

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