Dr. H. Philip Stahl
Senior Optical Physicist at
SPIE Involvement:
Awards Committee | Board of Directors | Engineering, Science, and Technology Policy Committee | Executive Committee | Nominating Committee | Publications Committee | Strategic Planning Committee | Symposia Committee | Fellow status | Conference Program Committee | Symposium Chair | Conference Chair | Track Chair | Author | Editor | Instructor
Area of Expertise:
Optical Engineering , Optical Metrology , Optical Fabrication , Systems Engineering , Optical Testing , Interferometry
Profile Summary

Dr. H. Philip Stahl is a Senior Optical Physicist at NASA MSFC currently leading an effort to mature technologies for a new large aperture telescope to replace the Hubble Space Telescope. Previous assignments include Mirror Technology lead for the James Webb Space Telescope. Dr. Stahl is a leading authority in optical metrology, optical engineering, and phase-measuring interferometry. Many of the world's largest telescopes have been fabricated with the aid of high-speed and infrared phase-measuring Interferometers developed by him, including the Keck, VLT and Gemini telescopes. Dr. Stahl is a Fellow of SPIE, Fellow of OSA, member of AAS and IAU. He was the 2014 SPIE President and an ICO Vice-President (2005-11). He earned his PhD (1985) and MS (1983) in Optical Science at the University of Arizona Optical Sciences Center. He earned a BA in Physics and Mathematics from Wittenberg University in 1979.
Publications (131)

PROCEEDINGS ARTICLE | November 20, 2017
Proc. SPIE. 10565, International Conference on Space Optics — ICSO 2010
KEYWORDS: Mathematical modeling, Telescopes, Mirrors, Data modeling, Space telescopes, Astronomical imaging, Infrared telescopes, Optical instrument design, Statistical modeling, James Webb Space Telescope

PROCEEDINGS ARTICLE | October 5, 2017
Proc. SPIE. 10401, Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems
KEYWORDS: Mirrors, Wavefronts, Exoplanets, Integrated modeling, Space telescopes, Astrophysics, Performance modeling, Thermal modeling, Systems modeling

PROCEEDINGS ARTICLE | September 6, 2017
Proc. SPIE. 10374, Optical Modeling and Performance Predictions IX
KEYWORDS: Telescopes, Mirrors, Error analysis, Space telescopes, Structural design, James Webb Space Telescope, Off axis mirrors

PROCEEDINGS ARTICLE | September 6, 2017
Proc. SPIE. 10374, Optical Modeling and Performance Predictions IX
KEYWORDS: Mirrors, Interferometry, Space mirrors, Thermal effects, Lightweight mirrors, Zerodur, Thermal modeling, Cryogenics, Temperature metrology

PROCEEDINGS ARTICLE | September 5, 2017
Proc. SPIE. 10371, Optomechanical Engineering 2017
KEYWORDS: Mirrors, Astronomy, Data modeling, Imaging systems, Imaging spectroscopy, Exoplanets, Finite element methods, Astrophysics, Systems modeling, Planetary systems

PROCEEDINGS ARTICLE | September 5, 2017
Proc. SPIE. 10398, UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VIII
KEYWORDS: Point spread functions, Telescopes, Mirrors, Speckle, Wavefronts, Coronagraphy, Space telescopes, Planets

Showing 5 of 131 publications
Conference Committee Involvement (35)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
An Optical Believe It or Not: Key Lessons Learned V
19 August 2018 | San Diego, California, United States
Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave
10 June 2018 | Austin, Texas, United States
UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VIII
6 August 2017 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Showing 5 of 35 published special sections
Course Instructor
SC392: Testing Aspheric Components
This course summarizes aspheric component testing techniques, including: profilometry, interferometry, and geometric ray tests. Both null and non-null configurations are presented as well as specialized techniques: phase-measuring interferometry; CGH, two-wavelength, and infrared interferometry; sparse-array sampling; moire interferometry; and the Ronchi test.
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