Dr. Hagen Lorenz
at Physikalisch-Technische Bundesanstalt
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 27, 2014
Proc. SPIE. 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
KEYWORDS: Calibration, Glasses, Interfaces, Silicon, Interferometry, Humidity, Epoxies, Neodymium, Adhesives, Temperature metrology

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