Hai Lin
Senior Photonic Engineer at
SPIE Involvement:
Conference Program Committee
Area of Expertise:
Ge, GeSn, SiGeSn semiconductors , Characterization: XRD, SEM, TEM, RAMAN, XPS, PL , epitaxial growth , Molecular Beam Epitaxy , empirical psedopotential method simulation , optoelectronic
Conference Committee Involvement (1)
Optoelectronic Devices and Integration IV
5 November 2012 | Beijing, China
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