Dr. Haibo Liu
at Dalian Univ of Technology
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | August 9, 2012
OE Vol. 51 Issue 8
KEYWORDS: Calibration, Charge-coupled devices, Sensors, CCD cameras, Scattering, Error analysis, Light scattering, Laser scattering, Laser beam diagnostics, CCD image sensors

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