Dr. Haidar de Fornel
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 17, 2004
Proc. SPIE. 5458, Optical Micro- and Nanometrology in Manufacturing Technology
KEYWORDS: Polarization, Spatial frequencies, Scattering, Surface roughness, Near field scanning optical microscopy, Near field, Prototyping, Surface finishing, Iridium, Near field optics

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