Haihong Hou
at Shanghai Institute of Optics and Fine Mechanics
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | November 14, 2007
Proc. SPIE. 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Refractive index, Multilayers, Data modeling, Scattering, Dielectrics, Interfaces, Light scattering, Optical coatings, Laser scattering, Surface roughness

PROCEEDINGS ARTICLE | February 10, 2005
Proc. SPIE. 5638, Optical Design and Testing II
KEYWORDS: Thin films, Optical amplifiers, Optical spheres, Scattering, Light scattering, Surface roughness, Atomic force microscopy, Optical testing, Profilometers, Scatter measurement

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