Dr. Haijun Zhang
at Zhejiang Univ
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | December 31, 2008
Proc. SPIE. 7130, Fourth International Symposium on Precision Mechanical Measurements
KEYWORDS: Microelectromechanical systems, Light sources, Reliability, Interferometry, Nondestructive evaluation, Signal processing, 3D metrology, Aluminum, Optical scanning systems, Natural surfaces

PROCEEDINGS ARTICLE | December 31, 2008
Proc. SPIE. 7130, Fourth International Symposium on Precision Mechanical Measurements
KEYWORDS: Actuators, Laser sources, Manufacturing, Power supplies, Semiconductor lasers, Thermal analysis, Bridges, Excimer lasers, Convection, Laser systems engineering

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Metrology, Optical amplifiers, Calibration, Scanners, Crystals, Atomic force microscopy, Atomic force microscope, Feedback loops, Scanning tunneling microscopy, Scanning probe microscopes

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Iron, Metals, Image processing, Corrosion, Image acquisition, Control systems, Atomic force microscopy, Atomic force microscope, Feedback control, Liquids

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Nanotechnology, Polishing, Image processing, Scanners, Photons, Image acquisition, Atomic force microscopy, Atomic force microscope, Feedback control, Surface finishing

PROCEEDINGS ARTICLE | September 20, 2002
Proc. SPIE. 4919, Advanced Materials and Devices for Sensing and Imaging
KEYWORDS: Sensors, Calibration, Electrodes, Image processing, Laser development, Control systems, Semiconductor lasers, Optoelectronics, Signal processing, Feedback control

Showing 5 of 7 publications
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