Hailin Shi
at Chongqing Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 March 2020
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Light sources, Clocks, Visualization, Sensors, Computer programming, Image sensors, Optical encoders, Photomasks, CCD image sensors, Prototyping

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