Dr. Shen Haiping
Lecturer at Fudan Univ
SPIE Involvement:
Author
Area of Expertise:
Lighting , Light source reliability , Metrology
Profile Summary

Haiping Shen received his Bachelor’s degree in 2003 and Ph.D. in 2008 in optical engineering from Zhejiang University. During his graduate student period, he spent four years in the research on LED metrology in Everfine Company. He is now working in the department of Light Sources & Illuminating Engineering, Fudan University. His research interest is in the photometric and colorimetric metrology, and reliability analysis for light sources, especially LED light sources. He has published 40 papers and given 10 conference presentations.
Publications (7)

Proceedings Article | 15 October 2012
Proc. SPIE. 8484, Twelfth International Conference on Solid State Lighting and Fourth International Conference on White LEDs and Solid State Lighting
KEYWORDS: Accelerated life testing, Light emitting diodes, Sensors, Solid state lighting, Reliability, Optical testing, Uncertainty analysis, Time metrology, Illumination engineering, Temperature metrology

Proceedings Article | 15 October 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Light sources, Light emitting diodes, Image processing, Spectroscopy, Lamps, Optical testing, Digital imaging, Distance measurement, Charge-coupled devices, Stray light

SPIE Journal Paper | 18 July 2012
OE Vol. 51 Issue 7
KEYWORDS: Light emitting diodes, Modulation, Pulsed laser operation, Optical filters, Lamps, Optical engineering, Photodiodes, Temperature metrology, Light sources, Ranging

Proceedings Article | 12 January 2011
Proc. SPIE. 7991, Display, Solid-State Lighting, Photovoltaics, and Optoelectronics in Energy II
KEYWORDS: Accelerated life testing, Light sources, Light emitting diodes, Manufacturing, Reliability, Gallium nitride, Epoxies, Illumination engineering, Temperature metrology, Blue light emitting diodes

Proceedings Article | 28 December 2010
Proc. SPIE. 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Light sources, Light emitting diodes, Calibration, Solid state lighting, Reliability, Resistance, Uncertainty analysis, Temperature sensors, Standards development, Temperature metrology

Showing 5 of 7 publications
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