Dr. Haiyong Gan
Scientist at National Institute of Metrology
SPIE Involvement:
Publications (15)

Proceedings Article | 18 January 2019
Proc. SPIE. 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Mirrors, Light sources, Calibration, Spectroscopy, Mercury, Lamps, Fourier transforms, Monochromators, Off axis mirrors, Light

Proceedings Article | 12 December 2018
Proc. SPIE. 10845, Three-Dimensional Image Acquisition and Display Technology and Applications
KEYWORDS: Light sources, Reflection, Imaging systems, Cameras, Calibration, Image processing, Digital cameras, Bidirectional reflectance transmission function, Statistical modeling, RGB color model

Proceedings Article | 7 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Mirrors, Light sources, Calibration, Error analysis, Mercury, Lamps, Fourier transforms, Neon, Monochromators, Light

Proceedings Article | 28 February 2017
Proc. SPIE. 10256, Second International Conference on Photonics and Optical Engineering
KEYWORDS: Photodetectors, Ferroelectric materials, Calibration, Crystals, Photonic crystals, Photodiodes, Nonlinear optics, Frequency conversion, Nonlinear crystals, Single photon detectors

Proceedings Article | 19 October 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Photodetectors, Calibration, Silicon, Spectral calibration, Radiometry, Cryogenics

Showing 5 of 15 publications
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