Dr. Haiyong Gan
Scientist at National Institute of Metrology
SPIE Involvement:
Author
Publications (30)

Proceedings Article | 5 November 2020 Paper
Proc. SPIE. 11567, AOPC 2020: Optical Sensing and Imaging Technology
KEYWORDS: Microscopes, Light sources, Sensors, Calibration, Microscopy, Luminescence, Integrating spheres, Radiometry

Proceedings Article | 5 November 2020 Paper
Proc. SPIE. 11567, AOPC 2020: Optical Sensing and Imaging Technology
KEYWORDS: Optical fibers, Photodetectors, Photon counting, Light sources, Sensors, Multiplexers, Single photon detectors, Signal detection

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Optical components, Metrology, Optical spheres, Radio optics, Sensors, Laser metrology

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Photodetectors, Light sources, Polarization, Silicon, Supercontinuum sources, Radiometry, Monochromators, Cryogenics

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Optical parametric oscillators, Femtosecond phenomena, Reflection, Sensors, Mode locking, Silicon, Bidirectional reflectance transmission function, Harmonic generation, Pulsed laser operation, Laser systems engineering

Showing 5 of 30 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top