Hakchu Lee
Engineer at Keysight Technologies Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 September 2008
Proc. SPIE. 7101, Advances in Optical Thin Films III
KEYWORDS: Thin films, Ellipsometry, Retroreflectors, Polarization, Reflection, Optical coatings, Heterodyning, Solids, Thin film coatings, Dielectric polarization

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