Hakyu Choi
at Dongbu Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 4 April 2008
Proc. SPIE. 6923, Advances in Resist Materials and Processing Technology XXV
KEYWORDS: Lithography, Cadmium, Lenses, Glasses, Inspection, Head-mounted displays, Critical dimension metrology, Photoresist processing, Semiconducting wafers, Resolution enhancement technologies

Proceedings Article | 21 March 2008
Proc. SPIE. 6921, Emerging Lithographic Technologies XII
KEYWORDS: Diffraction, CMOS sensors, Finite-difference time-domain method, Cell phones, Microlens array, Copper indium disulfide, Image processing, Ray tracing, Diodes, Optical fiber cables

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