Prof. Sen Han
at Univ of Shanghai For Science and Technology
SPIE Involvement:
Conference Program Committee | Conference Chair | Author | Editor | Student Chapter Advisor
Publications (41)

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Zemax, Lens design, Aspheric lenses, Visibility, Fizeau interferometers

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Visualization, Interferometers, Control systems, Data transmission, Optical testing, Measurement devices, Control systems design, Environmental sensing

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Transceivers, Metrology, Interferometers, Wavefronts, Sensor networks, Precision measurement, Analytical research, Control systems design, Sensor technology, Environmental sensing

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Mirrors, MATLAB, Error analysis, Interferometry, Computer simulations

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Zemax, Photovoltaics, Interferometers, Wavefronts, Structural design, Mechanical engineering, Spherical lenses, Tolerancing, Fizeau interferometers

Showing 5 of 41 publications
Proceedings Volume Editor (13)

Showing 5 of 13 publications
Conference Committee Involvement (51)
Applied Optical Metrology III
1 August 2021 | San Diego, California, United States
Optical System Alignment, Tolerancing, and Verification XIV
1 August 2021 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Chiba, Japan
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Showing 5 of 51 Conference Committees
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