Prof. Sen Han
at Univ of Shanghai For Science and Technology
SPIE Involvement:
Strategic Planning Committee | Fellow status | Conference Chair | Conference Program Committee | Author | Editor | Student Chapter Advisor
Publications (45)

Proceedings Article | 26 December 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Ferroelectric materials, Sensors, Ceramics, Laser applications, Resistance, Control systems, Data acquisition, Transducers, Precision measurement, Bridges

SPIE Conference Volume | 21 December 2018

SPIE Conference Volume | 14 December 2018

Proceedings Article | 12 December 2018
Proc. SPIE. 10847, Optical Precision Manufacturing, Testing, and Applications
KEYWORDS: Nonuniformity corrections, Mirrors, Gaussian beams, Interferometers, Sensors, Coating, Control systems, Laser stabilization, Beam shaping, Laser beam diagnostics

Proceedings Article | 12 December 2018
Proc. SPIE. 10847, Optical Precision Manufacturing, Testing, and Applications
KEYWORDS: Photovoltaics, Mirrors, Ferroelectric materials, Error analysis, Ceramics, Interferometry, Phase shift keying, Gemini Planet Imager, Phase shifts, Fizeau interferometers

Proceedings Article | 8 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Photovoltaics, Mirrors, Statistical analysis, Interferometers, Calibration, Error analysis, Interferometry, Computer generated holography, Precision measurement, Analytical research

Showing 5 of 45 publications
Conference Committee Involvement (42)
International Conference on Optical Instruments and Technology 2019: Optoelectronic Measurement Technology and System
26 October 2019 | Beijing, China
Optical Design and Testing IX
21 October 2019 | Hangzhou, China
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Applied Optical Metrology III
13 August 2019 | San Diego, California, United States
Optical Modeling and System Alignment
12 August 2019 | San Diego, California, United States
Showing 5 of 42 published special sections
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