The laser diode (LD) is modulated by the injection current of triangular waveform and a photo diode (PD) is packaged in the rear of the LD. The laser reflected by the target re-enters the cavity of LD and contains the target’s displacement information. The information is carried within the laser intensity and can be pickup by the PD. We call this laser intensity as self-mixing interferometry (SMI) signal. While processing the sensing SMI signals, we should carefully determine the windowing function and reduce the effect of windowing in the FFT and IFFT process while applying the mathematical model. Simulation results show that the proposed design is able to accomplish the measurement of micro-displacement with high resolution and great accuracy.
When a fraction of external optical feedback re-enters inside cavity of a laser diode (LD), the laser intensity and its wavelength will thus be altered. The LD in this case is often called as a self-mixing laser diode (SMLD). This paper presents an SMLD for profile measurement. The LD is modulated by the injection current in triangular waveform and a target to be measured is installed on a mechanic scanning device. The reflection light by the target contains its surface profile. The profile information is then carried in the laser intensity and can be pickup by a photodiode packaged in the rear of the LD. We call this modulated laser intensity as self-mixing interferometric (SMI) signal. In this paper, a new algorithm is developed to retrieve the profile from the SMI signal. Results show that the proposed design is able to achieve the measurement of profile with high resolution.
This work proposes to measure the topography of microstructure surfaces using a self-mixing interference (SMI) configuration. The theoretical measurement model is built using beam-expanded plane wave method and considering SMI effect. The interference patterns for different objects are obtained based on the presented model. In addition, an algorithm for reconstructing the three-dimensional surface is implemented and applied onto an object with spherical surface. The presented work shows the potential application for topography measurement using a compact SMI configuration.