Hanan Halaq
at Univ Sidi Mohamed Ben Abdellah
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 25 April 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Fringe analysis, Holograms, Holography, 3D image reconstruction, Digital holography, Charge-coupled devices, Spatial resolution, Digital recording, Holographic interferometry, CCD image sensors

Proceedings Article | 25 April 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Superposition, Fringe analysis, Holograms, Holography, 3D image reconstruction, Digital holography, Sensors, Interferometry, Wavefronts, Holographic interferometry

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