Dr. Hanfei Yan
Assistant Physicist at Brookhaven National Lab
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | September 29, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Microscopes, Diffraction, Phase contrast, Imaging systems, Luminescence, Nanoprobes, Scanning probe microscopy, Hard x-rays, Scanning probe microscopes, Absorption

PROCEEDINGS ARTICLE | September 25, 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Mirrors, X-ray optics, X-rays, X-ray diffraction, Wavefronts, Optical testing, Phase retrieval, Zone plates, Hard x-rays, Crystal optics

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Imaging systems, Scattering, Stereoscopy, Luminescence, Nanoprobes, Hard x-rays, X-ray fluorescence spectroscopy, 3D image processing, Fluorescence tomography, Absorption

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Light sources, X-rays, Fluorescence spectroscopy, Nanoprobes, Synchrotrons, Hard x-rays, X-ray fluorescence spectroscopy

PROCEEDINGS ARTICLE | November 3, 2016
Proc. SPIE. 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
KEYWORDS: Nanoengineering, Electrodes, X-rays, Germanium, X-ray diffraction, X-ray microscopy, Electron microscopy, Synchrotrons, Chemical reactions, Temperature metrology

PROCEEDINGS ARTICLE | October 19, 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Multilayers, X-ray optics, Metrology, Sputter deposition, X-rays, Silicon, Nitrogen, Reflectivity, Control systems, Scanning electron microscopy

Showing 5 of 7 publications
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