Hang-Eun Joe
at Yonsei University
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 6, 2013
Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II
KEYWORDS: Semiconductors, Confocal microscopy, Optical fibers, Light emitting diodes, Fiber optics, Luminescence, Single mode fibers, Spatial resolution, Fiber optics tests, Patterned sapphire substrate

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top