Hang Dong
at Tianjin Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Imaging systems, Cameras, Calibration, Image processing, Error analysis, Computing systems, 3D metrology, Algorithm development, Iterative methods, 3D image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top