Dr. Hans K. Pulker
at Univ Innsbruck
SPIE Involvement:
Fellow status | Conference Chair | Author
Publications (9)

PROCEEDINGS ARTICLE | October 5, 2005
Proc. SPIE. 5963, Advances in Optical Thin Films II
KEYWORDS: Refractive index, Argon, Annealing, Particles, Ions, Heat treatments, Oxygen, Niobium, Plasma, Absorption

PROCEEDINGS ARTICLE | October 5, 2005
Proc. SPIE. 5963, Advances in Optical Thin Films II
KEYWORDS: Thin films, Refractive index, Argon, Particles, Ions, Oxygen, Plating, Niobium, Tantalum, Plasma

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Oxides, Refractive index, Argon, Metals, Ions, Resistance, Heat treatments, Oxygen, Atmospheric optics, Absorption

PROCEEDINGS ARTICLE | November 4, 1994
Proc. SPIE. 2253, Optical Interference Coatings
KEYWORDS: Thin films, Argon, Sputter deposition, Ions, Silicon, Nitrogen, Transmittance, Aluminum, Plating, Protactinium

PROCEEDINGS ARTICLE | November 4, 1994
Proc. SPIE. 2253, Optical Interference Coatings
KEYWORDS: Carbon, Thin films, Refractive index, Multilayers, Chemical species, Metals, Glasses, Ions, Coating, Transmission electron microscopy

PROCEEDINGS ARTICLE | December 1, 1990
Proc. SPIE. 1323, Optical Thin Films III: New Developments
KEYWORDS: Thin films, Lithium, Sensors, Argon, Ions, Coating, Scanning electron microscopy, Plating, Tantalum, Plasma

Showing 5 of 9 publications
Conference Committee Involvement (1)
Thin Film Technologies III
19 September 1988 | Hamburg, Germany
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