Dr. Hans Reinhard Schubach
at Dantec Dynamics GmbH
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 May 2011
Proc. SPIE. 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering

Proceedings Article | 28 April 2006
Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology
KEYWORDS: Electronic components, Temperature metrology, Microelectromechanical systems, Sensors, 3D metrology, Finite element methods, Speckle interferometry, Aerospace engineering, Reliability, Spatial resolution

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