Hans J. Verboom
at Plasmon Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 January 2002 Paper
Proceedings Volume 4342, (2002) https://doi.org/10.1117/12.453390
KEYWORDS: Signal to noise ratio, Digital filtering, Optical recording, Binary data, Data modeling, Sensors, Plasmons, Error analysis, Optical aberrations, Statistical modeling

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