Haoran Guo
at Nokia
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 25 May 2018
OE Vol. 57 Issue 05
KEYWORDS: Data modeling, Clouds, Solid modeling, Computer aided design, Holography, Sensors, Polarization, Optical engineering, Error analysis, Time metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top