Haoyu Lyu
at Univ of Shanghai For Science And Technology
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 13 September 2018
OE, Vol. 57, Issue 09, 094103, (September 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.9.094103
KEYWORDS: Zernike polynomials, Optical testing, Error analysis, Optical engineering, Interferometry, Nickel, Optical components, Testing and analysis, Iterative methods, Fizeau interferometers

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