Haoyu Lyu
at Univ of Shanghai For Science And Technology
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | September 13, 2018
OE Vol. 57 Issue 09
KEYWORDS: Zernike polynomials, Optical testing, Error analysis, Optical engineering, Interferometry, Nickel, Optical components, Testing and analysis, Iterative methods, Fizeau interferometers

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