Dr. Haruhiko Ohashi
at Japan Synchrotron Radiation Research Institute
SPIE Involvement:
Conference Chair | Conference Program Committee | Editor | Author
Publications (32)

SPIE Conference Volume | October 27, 2017

PROCEEDINGS ARTICLE | September 6, 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Diffraction, Mirrors, Optical design, Light sources, X-rays, Coating, Extreme ultraviolet, X-ray lasers, Free electron lasers, Light-matter interactions

PROCEEDINGS ARTICLE | May 11, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Mirrors, X-ray optics, X-rays, Silicon, Diagnostics, X-ray lasers, Laser optics, Hard x-rays, Free electron lasers, Crystallography

SPIE Conference Volume | December 5, 2016

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Mirrors, X-ray optics, Sensors, Laser development, CCD cameras, Collimation, Optical simulations, Spatial resolution, Synchrotron radiation, Laser beam diagnostics

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9511, Damage to VUV, EUV, and X-ray Optics V
KEYWORDS: Mirrors, Silica, Metals, X-rays, Silicon, Coating, Reflectivity, X-ray lasers, Grazing incidence, Free electron lasers

Showing 5 of 32 publications
Conference Committee Involvement (5)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
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