Dr. Haruhiko Ohashi
at Japan Synchrotron Radiation Research Institute
SPIE Involvement:
Conference Chair | Conference Program Committee | Author | Editor
Publications (31)

PROCEEDINGS ARTICLE | September 6, 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Mirrors, X-rays, Free electron lasers, Optical design, X-ray lasers, Light sources, Diffraction, Extreme ultraviolet, Light-matter interactions, Coating

PROCEEDINGS ARTICLE | May 11, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Mirrors, Laser optics, Silicon, X-ray lasers, Crystallography, Diagnostics, Free electron lasers, X-rays, X-ray optics, Hard x-rays

SPIE Conference Volume | December 5, 2016

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: X-ray optics, Synchrotron radiation, Laser development, Sensors, Spatial resolution, Mirrors, CCD cameras, Laser beam diagnostics, Collimation, Optical simulations

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9511, Damage to VUV, EUV, and X-ray Optics V
KEYWORDS: Silicon, X-rays, Silica, Mirrors, Grazing incidence, Coating, Reflectivity, Free electron lasers, X-ray lasers, Metals

SPIE Conference Volume | October 7, 2014

Showing 5 of 31 publications
Conference Committee Involvement (5)
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IV
12 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics III
1 August 2010 | San Diego, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top