Hayk V. Asriyan
at Yerevan State Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 11 June 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Semiconductors, Scattering, Microelectronics, Phonons, Field effect transistors, Stochastic processes, N-type semiconductors, Magnetic semiconductors, Semiconductor physics, Absorption

Proceedings Article | 23 May 2005
Proc. SPIE. 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III
KEYWORDS: Semiconductors, Scattering, Electrons, Interfaces, Silicon, Silver, Refraction, Aluminum, Phonons, Acoustics

Proceedings Article | 8 May 2003
Proc. SPIE. 5115, Noise and Information in Nanoelectronics, Sensors, and Standards
KEYWORDS: Semiconductors, Scattering, Electrons, Silicon, Reliability, Magnetism, Physics, Electroluminescence, Phonons, Acoustics

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